Overview
SEM3200 is a tungsten filament scanning electron microscope with high performance and wide application. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user friendly environment to characterize samples. What’s more, rich scalability helps the users to explore the world of microscopic imaging.
Specification
Model
Electro-Optical Systems
Electron Gun |
Pre-aligned medium-sized fork-type tungsten filament |
Resolution |
High Vaccum |
3 nm @ 30 kV (SE) |
4 nm @ 30 kV (BSE) |
8 nm @ 3 kV (SE) |
*Low Vaccum |
3 nm @ 30 kV (SE) |
Magnification |
1-300,000x (Film Magnification) |
1-1000,000x (Screen Magnification) |
Acceleration Voltage |
0.2 kV ~ 30 kV |
Probe Current |
≥1.2μA, Real-time display |
Imaging Systems
Detector |
Secondary Electron Detector (ETD) |
*Backscattered electron detector (BSED), *low vacuum secondary electron detector, *energy spectrometer EDS, etc. |
Image Format |
TIFF, JPG, BMP, PNG |
Vacuum System
Vacuum Model |
High Vacuum |
Better than 5×10-4 Pa |
Low Vacuum |
5 ~ 1000 Pa |
Control Mode |
Fully automatic control |
Sample Chamber
Camera |
Optical Navigation |
Monitoring in the Sample Chamber |
Sample Table |
Three Axis Automatic |
Five Axis Automatic |
Distance |
X: 120 mm |
X: 120 mm |
Y: 115 mm |
Y: 115 mm |
Z: 50 mm |
Z: 50 mm |
/ |
R: 360° |
/ |
T: -10° ~ +90° |
Software
Navigations |
Optical Navigation, Gesture Quick Navigation |
Automatic Functions |
Auto Brightness Contrast, Auto Focus, Automatic Dissipation |
Special Functions |
Intelligent Assisted Dispersion, *Large-Scale Image Stitching (Optional accessories) |
Installation Requirements
Space |
L≥ 3000 mm, W ≥ 4000 mm,
H ≥ 2300 mm |
Temperature |
20°C (68°F) ~ 25°C (77°F) |
Humidity |
≤ 50 % |
Power Supply |
AC 220 V(±10 %), 50 Hz, 2 kVA |