Overview
SEM2000 is a basic multi-functional analytical tungsten filament scanning electron microscope. The resolution at 20 kV can reach 3.9nm, support the upgrade of 30 kV voltage, and observe the microstructure information of submicroscale samples. It has a larger mobile range than the desktop electron microscope, suitable for rapid screening of samples to be tested, more expansion interfaces, can be equipped with BSED, EDS and other accessories, so that the application field is wider.
Specification
Parameters
Electron Gun |
Pre-aligned medium-sized fork-type tungsten filament |
Resolution |
3.9 nm @ 20 kV (SE) |
4.5 nm @ 20 kV (BSE) |
Magnification |
1 x~300,000 x |
Acceleration Voltage |
0.5 kV ~ 20 kV |
Imaging Systems
Detector |
Secondary Electron Detector (ETD) |
*Backscattered electron detector (BSED), *energy spectrometer EDS, etc. |
Image Format |
TIFF, JPG, BMP, PNG |
Vacuum System
High Vacuum |
Better than 5×10-4 Pa |
Control Mode |
Fully automated control system |
Pumps |
Mechanical Pump ×1, Molecular Pump ×1 |
Sample Chamber
Camera |
Optical Navigation |
Sample Table |
Two-axis automatic |
Distance |
X: 100 mm |
Y: 100 mm |
Software
Operating System |
Windows |
Navigations |
Optical Navigation, Gesture Quick Navigation |
Automatic Functions |
Auto Brightness Contrast, Auto Focus, Automatic Dissipation |
Special Functions |
Intelligent Assisted Dispersion, *Large-Scale Image Stitching (Optional accessories) |
Installation Requirements
Space |
L ≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm |
Temperature |
20°C (68°F) ~ 25°C (77°F) |
Humidity |
≤ 50 % |
Power Supply |
AC 220 V(±10 %), 50 Hz, 2 kVA |